Publications

21 results for Shih Hsien Lo

Modeling and analysis of gate leakage in ultra-thin oxide sub-50nm double gate devices and circuits
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2005
- ISQED 2005
Analysis and design of digital CMOS circuits in hybrid SOI-epitaxial technology with different crystal orientations
- - Koushik K. Das
  - Shih-Hsien Lo
  - et al.
- 2004
- IEEE International SOI Conference 2004
Challenges for accurate reliability projections in the ultra-thin oxide regime
- - E. Wu
  - W.W. Abadeer
  - et al.
- 1999
- IRPS 1999
Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides
- - S.H. Lo
  - D.A. Buchanan
  - et al.
- 1999
- IBM J. Res. Dev
Atomic-scale studies of electron transport through MOS structures
- - H.J. Wen
  - R. Ludeke
  - et al.
- 1998
- Applied Surface Science
Electrical characteristics and reliability of sub-3 nm gate oxides grown on nitrogen implanted silicon substrates
- - L.K. Han
  - S.W. Crowder
  - et al.
- 1997
- IEDM 1997
Modeling and characterization of n⁺- and p⁺-polysilicon-gated ultra-thin oxides (21-26 angstroms)
- - S.H. Lo
  - D.A. Buchanan
  - et al.
- 1997
- VLSI Technology 1997
Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's
- - S.H. Lo
  - D.A. Buchanan
  - et al.
- 1997
- IEEE Electron Device Letters
Reliability and integration of ultra-thin gate dielectrics for advanced CMOS
- - D.A. Buchanan
  - S.H. Lo
- 1997
- Microelectronic Engineering
Image force effects and the dielectric response of SiO₂ in electron transport across metal-oxide-semiconductor structures
- - H.J. Wen
  - R. Ludeke
  - et al.
- 1997
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films