Fully subtractive Ru Topvia interconnects with minimum 9 nm-space airgap for RC performance and reliability enhancement as post-Cu interconnectsKoichi MotoyamaJaemyung Choiet al.2024IEDM 2024
Evaluation of different metal preclean conditions for MOL for 2nm and beyondSamuel Swaroop MunnangiAndrew Simonet al.2024ASMC 2024