Novel Advanced Low-k Dielectric for 2 nm and Beyond Cu and Post Cu Dual Damascene BEOL Interconnect TechnologiesSon NguyenHuai Huanget al.2025VLSI Technology and Circuits 2025
Backside power distribution for nanosheet technologies beyond 2nmRuilong XieWonhyuk Honget al.2024VLSI Technology and Circuits 2024