Publications

3 results for David P. Vallett

Time-resolved optical characterization of electrical activity in integrated circuits
- - James C. Tsang
  - Jeffrey Alan Kash
  - et al.
- 2000
- Proceedings of the IEEE
Picosecond imaging circuit analysis
- - James C. Tsang
  - Jeffrey A. Kash
  - et al.
- 2000
- IBM J. Res. Dev
Diagnosis and characterization of timing-related defects by time-dependent light emission
- - D.R. Knebel
  - P.N. Sanda
  - et al.
- 1998
- IEEE ITC 1998