200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics
- H. Jäderström
- Yu. Murin
- et al.
- 2008
- Physical Review C - Nuclear Physics
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.