PaperThe microstructure of high-critical current superconducting filmsP. Chaudhari, F.K. LeGoues, et al.Science
PaperAutomatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patternsArmin Segmüller, J. Angilelo, et al.Journal of Applied Physics
PaperGe-GaAs superlattices by molecular beam epitaxyChin-An Chang, Armin Segmüller, et al.Applied Physics Letters
PaperOriented growth of niobium and molybdenum on GaAs crystalsM. Eizenberg, Armin Segmüller, et al.Journal of Applied Physics
