PublicationIEEE T-EDPaperVA-6 Investigation of Stress Effects on the DC Characteristics of GaAs MESFET's Through the Use of Externally Applied LoadsIEEE T-EDView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1987PublicationIEEE T-EDAuthorsT.N. JacksonJean-Claude RamirezL.S. CooperJames J. RosenbergL.B. FreundIBM-affiliated at time of publicationShare
