J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
The roughness of spin-cast polymer films arises from thermally activated capillary waves during preparation and typically amounts to about 0.5 nm rms measured on a micrometer-sized surface area. Templating from atomically flat mica substrates allows the creation of polymer films with a surface roughness approaching the molecular scale. Three regimes of spatial frequencies are identified in which the roughness is controlled by different physical mechanisms. We find that frozen-in elastic pressure waves ultimately limit the flatness of polymer films. © 2009 American Chemical Society.
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
Hiroshi Ito, Reinhold Schwalm
JES
R. Ghez, M.B. Small
JES