John D. Cressler, James H. Comfort, et al.
IEEE Electron Device Letters
Over the period of the past five years, major advances in techniques for the low-temperature preparation of epitaxial films in the silicon!germanium materials system have led to remarkable progress in silicon-based device technology. The fundamental chemical principles underlying one of these growth methods, ultrahigh vacuum/chemical vapor deposition (UHV/CVD), are described in this overview. A variety of unique devices and structures, for example high-speed graded bandgap heterojunction bipolar transistors and n-type resonant tunneling diodes, will be discussed. The role of fundamental interface chemistry in making such structures possible will also be considered. © 1992 IEEE.
John D. Cressler, James H. Comfort, et al.
IEEE Electron Device Letters
Sophie Verdonckt-Vandebroek, Emmanuel F. Crabbé, et al.
IEEE Electron Device Letters
Bernard S. Meyerson, Franz J. Himpsel, et al.
Applied Physics Letters
John D. Cressler, James H. Comfort, et al.
IEEE Transactions on Electron Devices