I. Khubeis, J.F. Ziegler
Nuclear Inst. and Methods in Physics Research, B
We have evaluated the trace-element sensitivty of ion-induced x-ray analysis on residues from water samples using 700-keV protons. We find that most elements of interest can be detected in quantities below one part per billion in running times of about 3 min. We discuss in detail the necessary steps for absolute calibration of the analysis system, and the process of sample preparation in countries where high-purity substrates are difficult to obtain.
I. Khubeis, J.F. Ziegler
Nuclear Inst. and Methods in Physics Research, B
A. Lurio, J.F. Ziegler
Applied Physics Letters
R.J. Von Gutfeld, J.F. Dicello, et al.
Applied Physics Letters
J.F. Ziegler, J.J. Cuomo, et al.
Applied Physics Letters