J.S. Noh, T.K. Nath, et al.
Materials Research Society Symposium-Proceedings
Time-resolved measurements of spin-transfer-induced (STI) magnetization reversal were made in current-perpendicular spin-valve nanomagnetic junctions subject to a pulsed current bias. These results can be understood within the framework of a Landau-Lifshitz-Gilbert equation that includes STI corrections and a Langevin random field for finite temperature. Comparison of these measurements with model calculations demonstrates that spin-transfer induced excitation is responsible for the observed magnetic reversal in these samples. © 2004 The American Physical Society.
J.S. Noh, T.K. Nath, et al.
Materials Research Society Symposium-Proceedings
V. Foglietti, W.J. Gallagher, et al.
Applied Physics Letters
M.J. Rooks, E. Kratschmer, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
R.H. Koch, J.R. Lloyd, et al.
Physical Review Letters