K.A. Miller, C. John, et al.
Thin Solid Films
A widely used assignment scheme for Si 2p core-level photoemission studies of silicon oxidation relies solely on the formal oxidation state of the silicon. The tacit assumption of this assignment methodology is that second-neighbor effects have no measurable effect on observed Si 2p binding energies. In this letter, new experiments are combined with literature precedents to make the case that the second-neighbor effects play an important role in determining binding energy shifts. © 1998 American Institute of Physics.
K.A. Miller, C. John, et al.
Thin Solid Films
M.M. Banaszak Holl, P.F. Seidler, et al.
Applied Physics Letters
K.Z. Zhang, Leah M. Meeuwenberg, et al.
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
K.Z. Zhang, M.M. Banaszak Holl, et al.
Journal of Physical Chemistry B