Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
The scanning tunneling microscope (STM) is an important tool for studying the growth of ultrathin metal structures. The behavior of atoms arriving at the surface determines nanometer-scale structure that is readily measured with the STM. These structural features are important in determining properties. The variety of structural possibilities is illustrated with the difference between substrate-controlled island nucleation of Ni on Au(111) and diffussion-controlled aggregation of Ag on Au(111). The STM also provides a fairly complete picture of the intermixing that occurs in the early stages of room-temperature growth of Fe on Cu(100). © 1993.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
J.H. Stathis, R. Bolam, et al.
INFOS 2005