PaperDependence of the Flatband Voltage of Si-MOS on Distribution of Cesium in SiO2 Comparison of Two Implantation MethodsL. Krusin-ElbaumJES
PaperPersistent Current Density and Flux Creep in Bi-Sr-Ca-Cu-O/Ag Tapes with Splayed Columnar Defects from 0.8 GeV Proton IrradiationJ.R. Thompson, S. Patel, et al.IEEE TAS
PaperTransport in refractory metals and their interaction with SiO2: Comparison of tungsten and molybdenumL. Krusin-Elbaum, M.O. Aboelfotoh, et al.Thin Solid Films
PaperRoom-temperature ferromagnetic nanotubes controlled by electron or hole dopingL. Krusin-Elbaum, D.M. Newns, et al.Nature
