Summary Abstract: High resolution synchrotron photoemission study of silicon-metal interfaces

Lawrence Suchow, Norman R. Stemple

JES

A. Reisman, M. Berkenblit, et al.

JES

P.C. Pattnaik, D.M. Newns

Physical Review B

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films