Statistical characterization and on-chip measurement methods for local random variability of a process using sense-amplifier-based test structure

Abstract

An on-chip digital characterization method for local random variation in a process is presented. The method uses a sense-amplifier-based test circuit that uses digital voltage measurement instead of the analog current measurements of conventional techniques. The proposed circuit helps design fast on-chip built-in-self-test schemes for measuring random variation. A testchip is designed in 0.13μm CMOS and measured to show the effectiveness of the proposed circuit in extracting local random variation. ©2007 IEEE.