J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Transport properties of a single YBaCuO grain boundary have been investigated with a spatial resolution of 1 μm for voltages up to 70 meV. The conductance versus voltage characteristic is found to increase linearly for voltages between 6 and 40 mV. Below 2 mV this characteristic shows periodic oscillations. The origin of these features is discussed. © 1990.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
A. Gangulee, F.M. D'Heurle
Thin Solid Films