F. Legoues, A.R. Powell, et al.
Journal of Applied Physics
SiGe epitaxial growth on Si has been of interest for a number of years. In this work we consider the addition of 1 to 6% C into both Si and SiGe epitaxial material. We have used a solid, and a gas source, (acetylene), within a solid source SiGe molecular beam epitaxy system to produce a C flux. We have produced high-crystalline-quality Si1-yCy and Si1-x-yGexCy material using both approaches. In addition we demonstrate strain-symmetrical short-period superlattice structures grown on (100) Si with high Ge compositions ranging from 20% up to 100% Ge, at 100% Ge the Ge/Si1-xCy superllatice has an interface mismatch of 7%.
F. Legoues, A.R. Powell, et al.
Journal of Applied Physics
J.C. Tsang, K. Eberl, et al.
Applied Physics Letters
V.P. Kesan, P.G. May, et al.
Journal of Crystal Growth
J.M.C. Stork, G.L. Patton, et al.
VLSI Technology 1989