Y. Pastol, G. Arjavalingam, et al.
Electronics Letters
A novel technique for completely characterizing the frequency-dependent electrical properties of resistive transmission lines by short-pulse propagation is described. Time-domain measurements of the loss and dispersion of pulses propagated on two different lengths of the line under investigation, together with the measured low-frequency capacitance, are used to determine its broadband complex propagation constant and complex impedance. The technique is illustrated with measurements on a thin film package interconnection structure. The measured line characteristics are then used in a transient circuit analysis program to predict output waveforms generated by logic-like signals. © 1992 IEEE
Y. Pastol, G. Arjavalingam, et al.
Electronics Letters
W. Robertson, G. Arjavalingam, et al.
Journal of the Optical Society of America B: Optical Physics
Paul Coteus, H. Randall Bickford, et al.
IBM J. Res. Dev
Alina Deutsch, Paul W. Coteus, et al.
Proceedings of the IEEE