Conference paper
On-chip bus signaling using passive compensation
Yulei Zhang, Ling Zhang, et al.
EPEPS 2008
In this paper, the effect of metal roughness on the total loss, the extracted tan δ, and signal integrity of typical interconnections found in printed-circuit boards is extracted from measurements on three different materials. The differing characteristics of the roughened metal cross sections are highlighted, and a simplified, practical, 2-D, causal, broadband modeling methodology is shown. © 2007 IEEE.
Yulei Zhang, Ling Zhang, et al.
EPEPS 2008
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3DIC 2009
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IEEE Trans Electromagn Compat
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IEEE Transactions on Magnetics