Alina Deutsch, Paul W. Coteus, et al.
Proceedings of the IEEE
In this paper, the effect of metal roughness on the total loss, the extracted tan δ, and signal integrity of typical interconnections found in printed-circuit boards is extracted from measurements on three different materials. The differing characteristics of the roughened metal cross sections are highlighted, and a simplified, practical, 2-D, causal, broadband modeling methodology is shown. © 2007 IEEE.