Alina Deutsch, Gerard V. Kopcsay, et al.
IEEE T-MTT
In this paper, the effect of metal roughness on the total loss, the extracted tan δ, and signal integrity of typical interconnections found in printed-circuit boards is extracted from measurements on three different materials. The differing characteristics of the roughened metal cross sections are highlighted, and a simplified, practical, 2-D, causal, broadband modeling methodology is shown. © 2007 IEEE.
Alina Deutsch, Gerard V. Kopcsay, et al.
IEEE T-MTT
Alina Deutsch, Paul W. Coteus, et al.
Proceedings of the IEEE
Alina Deutsch, Christopher W. Surovic, et al.
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
Nickolas J. Mazzeo, Ian L. Sanders, et al.
IEEE Transactions on Magnetics