Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A canonical structure, devised by an earlier investigator to simplify the computation of radiation from small table-top products and their peripherals, is revisited. Though this structure contains only salient features of actual products, it has previously defied accurate analysis by available tools. In this short paper, the authors calculate the current distribution on the structure using a powerful analysis code they developed, and compare their results against previously measured data. The authors then include a finite-sized dielectric to serve as the substrate for the microstrip transmission line contained in the structure and repeat the analysis. For both structures, the nature of the observed resonances in the current is discussed, and insight into the radiation process is gained. © 1993 IEEE
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry