Publication
ESSDERC Satellite Symposium 1989
Conference paper

Semiconductor surface characterization with scanning tunneling microscopy

Abstract

The use of scanning tunneling microscopy (STM) as a tool for characterization and analysis of semiconductor surfaces is reviewed. In addition to atomic-scale imaging for structure determination, STM can also be used in a variety of ways to learn about surface (and even interface) electronic properties.

Date

Publication

ESSDERC Satellite Symposium 1989

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