R. Ghez, M.B. Small
JES
A new high resolution profilometer has been demonstrated based upon a non-contacting near field thermal probe. The scanned thermal probe provides a direct measurement of surface profile without dependence upon material properties. Non-contact profiling of resist and metal films have shown a lateral resolution of approximately 100 nanometers and a depth resolution below 10 nanometers. The basic theory of the new probe will be described and the results presented. © 1986.
R. Ghez, M.B. Small
JES
E. Burstein
Ferroelectrics
Ellen J. Yoffa, David Adler
Physical Review B
Ming L. Yu
Physical Review B