PaperEffect of TiOX nucleation layer on crystallization of Bi4Ti3O12 filmsDeborah A. Neumayer, Peter R. Duncombe, et al.Integrated Ferroelectrics
Conference paperUnderstanding mask-edge and trench-edge defects produced during solid phase epitaxy of amorphized regions in (001) and (Oil) Si: Observations and modelKatherine L. Saenger, Haizhou Yin, et al.MRS Spring 2007
Conference paperFDSOI CMOS with dual backgate control for performance and power modulationJeng-Bang Yau, Jin Cai, et al.VLSI-TSA 2009
Conference paperA selective etching process for chemically inert high-k metal oxidesKatherine L. Saenger, Harald F. Okorn-Schmidt, et al.MRS Proceedings 2002