Publication
NAPMRC 2003
Conference paper
Resonant soft x-ray scattering from magnetic thin films
Abstract
We have applied resonant SAS to characterize the chemical and magnetic heterogeneity of Co-based multilayers as well as CoPtCr-based perpendicular and longitudinal media. Separation of the chemical vs. magnetic heterogeneity is achieved by tuning the x-ray energy to both the Co and Cr edges.