PaperCollector turret for scanning electron microscopeOliver C. Wells, Conrad G. BremerReview of Scientific Instruments
PaperReciprocity between the reflection electron microscope and the low-loss scanning electron microscopeOliver C. WellsApplied Physics Letters
PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
Conference paperApplications of image diagnostics to metrology quality assurance and process controlJohn A. Allgair, Victor V. Boksha, et al.SPIE Advanced Microelectronic Manufacturing 2003
