PaperComparison of different models for the generation of electron backscattering patterns in the scanning electron microscopeOliver C. WellsScanning
PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
PaperCollector turret for scanning electron microscopeOliver C. Wells, Conrad G. BremerReview of Scientific Instruments
