PaperMagnetically filtered low-loss scanning electron microscopyOliver C. Wells, Eric MunroUltramicroscopy
PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy