PaperMagnetically filtered low-loss scanning electron microscopyOliver C. Wells, Eric MunroUltramicroscopy
PaperSchlieren method as applied to magnetic recording heads in the scanning electron microscopeOliver C. Wells, Matthias BrunnerApplied Physics Letters
PaperExamining deep holes by rocking the beam in the scanning electron microscopeOliver C. WellsReview of Scientific Instruments
PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
