Journal of Microscopy

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02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Reduction of edge penetration effect in the scanning electron microscope

Oliver C. Wells

Scanning

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Examination of uncoated photoresist by the low-loss electron method in the scanning electron microscope

Oliver C. Wells, Ping-Chin Cheng

Journal of Applied Physics

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Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Oliver C. Wells

Microscopy and Microanalysis

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An irradiation effect in thermally grown SiO₂

Oliver C. Wells

Applied Physics Letters

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