O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
We present picosecond backside optical measurements of currents and voltages, propagation delays, and glitches in flip-chip mounted silicon IC's. These signals are shown to compare well with prior circuit simulations, but they showed additional features not easily simulated. © 1992.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry
J.A. Barker, D. Henderson, et al.
Molecular Physics
J.K. Gimzewski, T.A. Jung, et al.
Surface Science