J. Tersoff
Applied Surface Science
An investigation of waveguide phase-shifting techniques was conducted for the purpose of establishing the design criteria for a device capable of meeting the following specifications: a phase-shift variable over a minimum range of 360° and a maximum phase error of ±5° at any phase setting over at last a 10 per cent frequency bandwidth. The dielectric loaded waveguide is the basis of a device which meets the design requirements. In this paper the analytical expressions applicable to the dielectric loaded waveguide cross section are derived using the transverse resonance procedure. A rigorous description of the propagation characteristics of this structure for various parameter values is obtained through the use of a high-speed computing machine. The excellent correlation between computed values and the data obtained from an experimental model is presented. © 1962, IEEE. All rights reserved.
J. Tersoff
Applied Surface Science
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Robert W. Keyes
Physical Review B