Michiel Sprik
Journal of Physics Condensed Matter
We present a high-resolution x-ray-scattering study of the temperature-dependent structure of Si(111) vicinally miscut by 4°along the 110 direction. At temperatures below 1159 K, the surface phase separates into flat 7×7 terraces and densely stepped regions, in agreement with previous reports. The angle between the phase-separated regions shows a temperature dependence consistent with both entropic and strain-induced step-step repulsive interactions. At temperatures above 1159 K, the surface is shown to exist as a single, logarithmically rough phase; the observed scattering line shapes demonstrate the presence of a long-range step-step repulsion of a magnitude comparable to the entropic repulsion. © 1995 The American Physical Society.
Michiel Sprik
Journal of Physics Condensed Matter
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters