PaperImaging and analysis of subsurface Cu interconnects by detecting backscattered electrons in the scanning electron microscopeL. Gignac, M. Kawasaki, et al.Journal of Applied Physics
PaperCoating, mechanical constraints, and pressure effects on electromigrationN.G. Ainslie, F.M. D'Heurle, et al.Applied Physics Letters
PaperScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lensO.C. WellsScanning
Conference paperExplanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory - a historical reviewO.C. WellsMSA Annual Meeting 1993
