A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 1997
This paper summarizes the status and potential of charge coupled device (CCD) memories. Cost performance tradeoffs for serial memories are reviewed, and the CCD chip organizations for slow and fast access systems are discussed. Comparisons are made between CCD and MOS random access memory (RAM) chips on the basis of cell area, support circuits, cell operation, and technology.
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 1997
L.M. Terman
ICSICT 1995
Christophe R. Tretz, C.T. Chuang, et al.
International Journal of Electronics
A. Deutsch, G.V. Kopcsay, et al.
IEEE Topical Meeting EPEPS 1995