F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Paper
On the Removal of Insulator Process Induced Radiation Damage from Insulated Gate Field Effect Transistors at Elevated Pressure
Abstract
No abstract available.
Related
Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Ellen J. Yoffa, David Adler
Physical Review B
Frank Stem
C R C Critical Reviews in Solid State Sciences