L Auslander, E Feig, et al.
Advances in Applied Mathematics
Paper
On the eigenvalues and eigenvectors of the integral equation formulation of the multi-interface neumann problem
Related
Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A. Skumanich
SPIE OE/LASE 1992
Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009