Sandip Kundu, Sudhakar M. Reddy
Journal of Electronic Testing
This paper considers the design of binary Mock codes that are capable of correcting up to t symmetric errors and detecting all unidirectional errors. A class of systematic t-symmetric-error-correcting/all-unidirectional-error-detecting (t-SyEC/AUED) codes are proposed. When t = 0 the proposed codes become Berger codes. For t = 1, the proposed codes are shown to be of “asymptotically optimal order.” Methods to construct nonsystematic t-SyEC/AUED codes for t = 2 and 3 are also presented in this paper. © 1990 IEEE
Sandip Kundu, Sudhakar M. Reddy
Journal of Electronic Testing
Sandip Kundu, Sudhakar M. Reddy
IEEE Design and Test of Computers
Sandip Kundu, Sudhakar M. Reddy, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sandip Kundu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems