Publication
ICICDT 2008
Conference paper

On-chip circuit for measuring jitter and skew with picosecond resolution

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Abstract

A circuit for on-chip measurement of long-term jitter, period jitter, and clock skew, is demonstrated. The circuit uses a single latch and a voltage-controlled delay element, and is evaluated in a stand-alone pad frame. Excellent reproduction of jitter measured by oscilloscope is shown. Measured jitter resolution is 1 ps or better. The circuit is also incorporated into a 2 GHz clock distribution network to obtain on-chip period jitter and clock skew measurements.

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Publication

ICICDT 2008

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