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Proceedings of SPIE - The International Society for Optical Engineering
This letter shows the application of a contrast measure for segmenting images and the relationship of this method to polynomial-based classification. The letter consists of two parts. In the first part, the relevance of the segmentation method is shown by applying the contrast measure to an important semiconductor manufacturing inspection problem. In the second part, the contrast measure is shown to be a particular case of a pixel classification technique based on polynomial decision functions and local texture features. This relationship integrates an important heuristic method with the rigorous theory of decision-theoretic classification. © 1988 IEEE
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
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