David J. Frank
IEDM 2002
In this paper, an analytical model of intrinsic carbon-nanotube field-effect transistors is presented. The origins of the channel carriers are analyzed in the ballistic limit. A noniterative surface-potential model is developed based on an analytical electrostatic model and a piecewise constant quantum-capacitance model. The model is computationally efficient with no iteration or numerical integration involved, thus facilitating fast circuit simulation and system optimization. Essential physics such as drain-induced barrier lowering and quantum capacitance are captured with reasonable accuracy. © 2010 IEEE.
David J. Frank
IEDM 2002
Hiroshi Miki, Naoki Tega, et al.
IEDM 2010
Cai Jin, David J. Frank, et al.
VLSI-TSA 2007
David J. Frank, Robert H. Dennard, et al.
Proceedings of the IEEE