Growth and scaling of oxide conduction after breakdown
Barry P. Linder, James H. Stathis, et al.
IRPS 2003
In this paper, an analytical model of intrinsic carbon-nanotube field-effect transistors is presented. The origins of the channel carriers are analyzed in the ballistic limit. A noniterative surface-potential model is developed based on an analytical electrostatic model and a piecewise constant quantum-capacitance model. The model is computationally efficient with no iteration or numerical integration involved, thus facilitating fast circuit simulation and system optimization. Essential physics such as drain-induced barrier lowering and quantum capacitance are captured with reasonable accuracy. © 2010 IEEE.
Barry P. Linder, James H. Stathis, et al.
IRPS 2003
Hon-Sum Philip Wong, David J. Frank, et al.
Proceedings of the IEEE
Sandip Tiwari, David J. Frank
IEEE T-ED
Leland Chang, Robert K. Montoye, et al.
VLSI Circuits 2010