Fei Liu, Zhen Zhang, et al.
IEEE Electron Device Letters
We use ultrahigh vacuum chemical vapor deposition to grow polycrystalline silicon carbide (SiC) on c-plane sapphire wafers, which are then annealed between 1250 and 1450°C in vacuum to create epitaxial multilayer graphene (MLG). Despite the surface roughness and small domain size of the polycrystalline SiC, a conformal MLG film is formed. By planarizing the SiC prior to graphene growth, a reduction in the Raman defect band is observed in the final MLG. The graphene formed on polished SiC films also demonstrates significantly more ordered layer-by-layer growth and increased carrier mobility for the same carrier density as the nonpolished samples. © 2011 American Institute of Physics.
Fei Liu, Zhen Zhang, et al.
IEEE Electron Device Letters
Naoki Tega, Hiroshi Miki, et al.
IRPS 2011
Kangguo Cheng, A. Khakifirooz, et al.
IEEE International SOI Conference 2010
Yanning Sun, Amlan Majumdar, et al.
IEDM 2014