Matteo Manica, Raphael Polig, et al.
IEEE/ACM TCBB
We present an integrated analog front-end (AFE) for the read-channel of a parallel scanning-probe storage device. The read/write element is based on an array of microfabricated silicon cantilevers equipped with heating elements to form nanometer-sized indentations in a polymer surface using integral atomic-force microscope (AFM) tips. An accurate cantilever model based on the combination of a thermal/electrical lumped-element model and a behavioral model of the electrostatic/mechanical part are introduced. The behavioral model of the electrostatic/mechanical part is automatically generated from a full finite-element model (FEM). The model is completely implemented in Verilog-A and was used to co-develop the integrated analog front-end circuitry together with the read/write cantilever. The cantilever model and the analog front-end were simulated together and the results were experimentally verified. The approach chosen is well suited for system-level simulation and verification/extraction in a design environment based on standard EDA tools. © 2007 IEEE.
Matteo Manica, Raphael Polig, et al.
IEEE/ACM TCBB
Jose Bonan, Christoph Hagleitner, et al.
Analog Integr Circuits Signal Process
Antonios Bazigos, Christopher L. Ayala, et al.
IEEE T-ED
Daniel Grogg, Yu Pu, et al.
SENSORS 2012