G. Arjavalingam, Yvon Pastol, et al.
IEEE Trans Antennas Propag
Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (~200 µm thick) polymer films are presented. © 1992, The Institution of Electrical Engineers. All rights reserved.
G. Arjavalingam, Yvon Pastol, et al.
IEEE Trans Antennas Propag
S.Y. Lin, G. Arjavalingam, et al.
Journal of Modern Optics
G. Arjavalingam, Barry J. Rubin
SPIE OE/LASE 1988
M. Heimlich, W. Robertson, et al.
Electronics Letters