Conference paperReal-time analysis of volatiles formed during processing of a chemically amplified resistF.A. Houle, G.M. Poliskie, et al.Microlithography 2000
PaperPhotochemical etching of silicon: The influence of photogenerated charge carriersF.A. HoulePhysical Review B
Conference paperKinetics of chemically amplified resistsG.M. Wallraff, W.D. Hinsberg, et al.Microlithography 1995
Conference paperChemistry controlling nanoscale pattern formation by deep UV photolithographyF.A. Houle, W.D. Hinsberg, et al.ACS Spring 1999