John G. Long, Peter C. Searson, et al.
JES
Paper
Measurements of conductivity near the metal-insulator critical point
Abstract
We present measurements of the electrical conductivity at low temperatures of bulk samples of Si
Related
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron