J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Proton-induced X-rays have been used for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique the absorbing film is supported directly on a substrate which under proton bombardment will generate the characteristic substrate radiation whose absorption in the film will be measured. Results are given for twelve different metals at the B K alpha (184 eV) line.
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Imran Nasim, Melanie Weber
SCML 2024