S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
The magnetization measurement on the nanometer scale was discussed. The magnetic tip of a magnetic force microscope within the point-probe approximation was calibrated. The calibration was proved for determining quantitatively a hysteresis loop for the single magnetic dot with perpendicular magnetic anisotropy.
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Julien Autebert, Aditya Kashyap, et al.
Langmuir
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Peter J. Price
Surface Science