R.B. Laibowitz, C.C. Tsuei, et al.
IEEE Transactions on Magnetics
The temperature dependence of the electrical resistance of a 4.4 cm long, 2.5 μm wide and 20 nm thick AuIn2 film has been measured from 10 K to 5 mK in a 600 Oe magnetic field. Below 3 K the resistance increases with decreasing temperature and above 150 mK is in quantitative agreement with two-dimensional localization theory. However below 150 mK we observe for the first time a crossover to a more slowly increasing resistance with decreasing temperaturature that is in quantitative agreement theories based on Coulomb-interaction effects. © 1981.
R.B. Laibowitz, C.C. Tsuei, et al.
IEEE Transactions on Magnetics
R.T. Collins, Z. Schlesinger, et al.
Physical Review Letters
R.B. Laibowitz, S.R. Heed, et al.
Philosophical Magazine
L.R. Narasimhan, C.K.N. Patel, et al.
Applied Physics Letters