W. Reuter, K. Wittmaack
Applications of Surface Science
It is shown that photoionization cross sections in the soft-x-ray region can be determined accurately with proton-induced x-ray spectroscopy. A film of the absorber is evaporated onto a substrate. The characteristic substrate radiation, generated with a proton beam, is measured with and without the absorber. The ionization cross section can then be calculated after a small and often negligible correction is made for the intensity change of the substrate radiation due to the energy loss of the proton beam passing through the absorber.
W. Reuter, K. Wittmaack
Applications of Surface Science
B.N. Eldridge, W. Reuter, et al.
ACS PMSE 1989
J.A. Cairns, A. Lurio, et al.
Journal of Catalysis
M.A. Frisch, W. Reuter, et al.
Review of Scientific Instruments