F. Tong, W.P. Risk, et al.
Electronics Letters
Raman micro-probe studies of diode laser facet temperatures in CW operation show a significant linear temperature rise below the laser threshold and a rapid nonlinear heating above the threshold. Dynamical measurements using current injection pulses show fast heating of the laser facet with a sub-microsecond risetime and much slower cooling within several micro-seconds. © 1990, The Institution of Electrical Engineers. All rights reserved.
F. Tong, W.P. Risk, et al.
Electronics Letters
W. Lenth, W.J. Kozlovsky, et al.
SPIE Singapore 1991
A.D.A. Hansen, H. Rosen
Journal of the Air and Waste Management Association
W. Lenth, R.M. Macfarlane
Journal of Luminescence