Jean-Olivier Plouchart, Noah Zamdmer, et al.
IEEE Transactions on Electron Devices
We propose and demonstrate a method of linearizing the IV and CV BSIM equations to eliminate the discontinuities in the higher order derivatives in the IV and CV models at Vds=0V. The result is a reasonably accurate prediction of distortion in common-gate circuits. We denote our solution LINFET. Except for a minor parameter recentering, LINFET can be used with existing parameter sets that have been extracted using the industrial standard BSIM models. We also show how the discontinuities arise in the current BSIM equation set.
Jean-Olivier Plouchart, Noah Zamdmer, et al.
IEEE Transactions on Electron Devices
Jean-Olivier Plouchart, Jonghae Kim, et al.
IEEE Journal of Solid-State Circuits
Xiaobin Yuan, Takashi Shimizu, et al.
IEEE T-ED
Kate A. Remley, Joe Gering, et al.
ARFTG 2007